CHEN, Zikeng. Image-level Face Forgery Detection Methods: Revolutions, Challenges and Future Look. Highlights in Science, Engineering and Technology, [S. l.], v. 161, p. 67–74, 2026. DOI: 10.54097/dwaesq34. Disponível em: https://datahset.org/index.php/ojs/article/view/13. Acesso em: 5 jun. 2026.